High Speed Serial Interfaces Challenge Embedded System DevelopersInformative and well-timed white paper validates need for innovative serial test solutions for embedded systems design.
Frost & Sullivan recently published a white paper titled "High Speed Serial Interfaces Challenge Embedded System Developers" that explores this topic by analyzing the concept of embedded systems and their importance, describes market trends, new market entrants and highlights both major problems and innovative solutions in this field.
"High performance embedded systems today require higher bandwidths and accompanying this trend, is the need for data communication to start using serial bus technology within the designs, both for intra-board (chip to chip) communications as well as inter-board communications," says Frost & Sullivan Measurement & Instrumentation Industry Manager Jessy Cavazos.
This whitepaper provides an overview of the trends towards serial busses, identifies the key challenges faced by designers, and highlights solutions that can help them overcome the challenges they are currently facing. Many of these key challenges are created by complexity and speed. Design engineers are having a difficult time finding the problems in the design, let alone fixing them. We explore the top five problems in this area, and present current and future solutions.
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